16 APRIL 2004

RADIATION LEVEL FOR THE FINAL ATLAS LAYOUT GEOMETRY   January 2003 Simulation Radiation Levels

UPDATE OF MUON TGC ELECTRONICS (FDR 01/03/01) click here

1.    Overview of the ATLAS Radiation Hardness Assurance Plan
2.   ATLAS Policy on Radiation Tolerant Electronics
3.   Radiation Constraints, Safety Factors and Radiation Tolerance Criteria
4.   Standard Test Methods and Standard Report Forms
5.   Radiation Facilities and Radiation Campaigns Agenda
6.  
7.   ATLAS Radiation Hardness Assurance Working Group (RHAWG)
8.   Radiation Hardness Assurance made by ATLAS Systems
9.   Tutorials on Radiation Effects
10.   Workshops and Conferences
11.   E.U. and U.S. Standard Radiation Tests Procedures
12.   Related Web Sites

        ATLAS has agreed a Quality Assurance plan dedicated to the radiation hardness of its electronics, whose aims are:

1.      The effects of radiation on electronics should have no consequences on the safety of the persons and of the global experiment. In other words, they should
         not induce any risks for the people working on irradiated electronics, and no fire risks.

2.     The electronic systems should be built in such a way they remain in conformity with their specifications during 10 years of operation in their specific radiation
        environment. This can be obtained either by designing radiation tolerant systems, or by designing less robust systems but forseeing their
        replacement after a certain period of time.

        The ATLAS radiation hardness assurance plan is based on three foundations:

1.     A good knowledge on the effects of radiation on electronic components and circuits, distributed thoughout in the ATLAS collaboration.
        This knowledge was reinforced owing to tutorial courses given in 1999 and 2000 in some of the Institutes and at CERN.

2.     A central co-ordination of the work made by the Sub-systems for the Radiation Hardness Assurance (RHA) of their electronics. This co-ordination is
        made in the framework of the ATLAS Radiation Hardness Assurance Working Group (RHA-WG). This working group was organised in 1999 in the
        framework of the ATLAS Technical Co-ordination, with the task of developing and operating a coherent plan for radiation hardness assurance in all the
        sub-systems. The members of this working group are:
        -    The ATLAS Radiation Hardness Assurance co-ordinator;
        -    The Radiation Hardness Assurance leaders from each ATLAS subsystems;
        -    The ATLAS Front-End Electronics co-ordinator.
        This working group meets every 3-4 months; its progress reports (minutes) are published in this Web Page.

3.     A set of common rules and standard tools (strategy for electronic components procurement, simulated radiation levels, safety factors and
        radiation tolerance criteria, standard radiation test methods, lists of radiation facilities, standard test reports, electronic components data base, etc.)
        agreed and used by the subsystems for pre-selecting generic components and for qualifying and purchasing batches of components. These rules and
        tools have been developped by the RHA co-ordinator in collaboration with the RHA leaders from the sub-systems, and agreed by ATLAS Technical
        Coordination. They are summarized in the ATLAS Policy on Radiation Tolerant Electronics revision 2 available on this web page.

        An Overview of the ATLAS Policy on Radiation Tolerant Electronics, published in the proceedings of the 6th Workshop on Electronics for LHC experiments
        (September 2000, Cracow), is available on this web page.

         The electronic components to be installed on the ATLAS detector or in the UX15 cavern will be radiation tolerant COTS components ("Commercial
         Off The Shelf") or radiation-hard ASICs. The ATLAS strategy for procurement of these components is the following:

1.     Procurement of radiation tolerant COTS components:

        Step 1:    Listing of all the radiation tolerant COTS components required by ATLAS sub-systems;
        Step 2:    Calculation of the Radiation Tolerance Criteria (RTC) for accepting components for use in a given ATLAS location;
        Step 3:    Pre-selection of the generic components (identified by their part number and manufacturer) which may satisfy the RTC. This requires
                       radiation tests based on ATLAS standard test methods. Test results are written in Standard Test Reports and put on the ATLAS
                       Electronic Components Data Base.
        Step 4:    Qualification of batches of components to be mounted in ATLAS electronic systems. This requires radiation tests based on ATLAS
           standard test methods.
        Step 5:    Purchase of qualified batches of components.

2.     Procurement of radiation hard ASICs:

        Step 1:    Listing of all the radiation hard ASICs required by ATLAS sub-systems;
        Step 2:    Calculation of the Radiation Tolerance Criteria (RTC) for accepting components for use in a given ATLAS location;
        Step 3:    Selection of a technology whose radiation hardness complies with RTC.
        Step 4:    Design of the ASICs using the selected radiation hard technology, or using a radiation-soft technology (for prototyping) plus a translation of
                       advanced prototypes into the selected radiation hard technology.
        Step 5:    Qualification of the radiation hardness of the final prototype designed with the radiation hard technology. This requires radiation tests based
                       on ATLAS standard test methods. The robustness of the ASICs with respect to the standard variations of the process must be checked by
                      worst case simulations and also by processing actual corner runs, if necessary.  Final test results shall be written in Standard Test Reports
                       and put on the ATLAS Electronic Components Data Base.
        Step 6:    Purchase of pre-series and series batches of ASICs manufactured with the radiation hard technology. Each batch must be accompanied by a
                       certificate of conformity in which the manufacturer guarantees that all the guaranteed electrical and radiation hardness parameters of the batch
                       have been checked on standard test vehicles and are within the specified limits. Additional radiation tests may be necessary, depending on the
                       results obtained on worst case simulations and on corner runs during the qualification phase.

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Contents of the Atlas Policy on Radiation Tolerant Electronics revision 2 :

- ATLAS Strategy for electronic components procurement ;
- ATLAS Simulated Radiation Levels ;
- ATLAS Safety Factors ;
- ATLAS Radiation tolerance criteria ;
- ATLAS Standard Radiation Test Methods;
- ATLAS Standard Test Report Forms ;
- List of Radiation Facilities ;
- Information on the ATLAS Electronic Components Data Base

Operating the Policy

The core of the Policy is the ATLAS Strategy for electronic components procurement, which includes a preselection of generic electronic components and a qualification of batches of components. For pre-selecting generic components and for qualifying batches of components, ATLAS Sub-Systems are invited to compute Radiation Tolerance Criteria first, then to perform radiation tests using the ATLAS Standard Test Methods, to write test results in the Standard Test Reports and to analyse them with the ATLAS RHA co-ordinator. Final test results must be sent to the ATLAS RHA co-ordinator together with other information (see section 6 of this web page) in order to be put into the database.

Remark: before starting radiation tests, it is suggested that ATLAS Sub-systems write a radiation campaign plan and discuss it with the ATLAS RHA co-ordinator.

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3.3. Units for Simulated Radiation Levels
-   TID (Total Ionising Dose); unit : Gray;
-   NIEL (Non Ionising Energy Loss); unit : 1 MeV equivalent neutron fluence;
-   SEE (Single Event Effects); unit : > total fluence of hadron having an energy > 20 MeV.

Simulated Radiation Levels have been computed for ATLAS by Mike Shupe, using the GEANT CALOR simulator.

3.4. Radiation Tolerance Criteria
The methods for computing Radiation Tolerant Criteria (RTC) are given in appendix 1 of the ATLAS Policy on Radiation Tolerance Electronics. The inputs of these computations are the simulated Radiation Levels (SRL), and the Safety Factors (SF) given above.

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Preparation of the tests:

ATLAS Sub-systems are invited to write their radiation campaign plans and discuss them with the ATLAS RHA co-ordinator before starting radiation tests.

Test results:

Test Results must be written in ATLAS Standard Report forms and analysed with the ATLAS RHA co-ordinator. Final test results must be sent to the ATLAS RHA co-ordinator with other information (see section 6 of this web page) in order to be put into the database.

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Coordination of the Radiation Tests

ATLAS Sub-systems are invited to consult the agenda and to consider sharing a radiation facility with other users. In the event that there is no practical possibility of sharing, the sub-systems should contact the facility directly for a reservation (see the contacts given in the list of facilities). After booking a radiation facility, ATLAS Sub-systems are requested to enter the relevant information concerning their tests into the agenda.

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7.1. Members:
 

Collaboration	Surname	First Name	Institute	Phone	Email
Pixels	*Sicho	Petr	Prague	+420 266 05 21 43	Petr.Sicho@cern.ch
SCT	*Mandic Anghinolfi Kaplon	Igor Francis Jan	Lubljana CERN CERN	+386 1 477 35 35 +41 22 76 90 84 +41 22 767 81 21	Igor.Mandic@ijs.si Francis.Anghinolfi@cern.ch Jan.Kaplon@cern.ch
TRT & FE Electronics	*Farthouat	Philippe	CERN	+41 22 767 62 21	Philippe.Farthouat@cern.ch
LARG	*Delataille Borgeaud Andrieux	Christophe Pierre Marie-Laure	LAL Orsay CEA Saclay ISN Grenoble	+33 01 64 46 89 39 +33 01 69 08 61 65 +33 04 76 28 41 28	Taille@lal.in2p3.fr borgeaud@hep.saclay.cea.fr andrieux@isn.in2p3.fr
TILE	*Teuscher	Richard	University of Chicago	+41 (0)22 767 85 94	Richard.Teuscher@cern.ch
MUON              CSC                           MDT                           TGC                           RPC	*O’Connor *Richter *Sasaki *Vari	Paul Robert Osamu Riccardo	BNL MPI Munchen KEK Japan INFN Roma	+1 631 344 75 77 +49 89 32 354 358 +81 298 64 54 36 +39 649 91 42 43	poc@bnl.gov Robert.Richter@cern.ch sosamu@post.kek.jp Riccardo.Vari@roma1.infn.it
Magnet Control	*Tyrvainen	Harri	CERN	+41 22 767 31 61	Harri.Tyrvainen@cern.ch
DCS	*Hallgren	Bjorn	CERN	+41 22 767 34 44	Bjorn.Inge.Hallgren@cern.ch
Crane	*Inigo-Golfin	Joaquin	CERN	+41 22 767 22 37	Joaquin.Inigo-Golfin@cern.ch
Cryogenics	*Kubischta	Werner	CERN	+41 22 767 17 97	Werner.Kubischta@cern.ch
Alarm Systems	*Nunes	Rui	CERN	+41 22 767 28 16	Rui.Nunes@cern.ch
Cooling & Ventilation (JCOV)	*Godlewski	Jan	CERN	+41-22-767 77 86	Jan.Godlewski@cern.ch
Radiation constraint	*Shupe	Mike	Univ. Arizona	+1 520 621 26 79	Shupe@uazhep.physics.arizona.edu
ATLAS TC	*Dentan	Martin	CERN / CEA Saclay	+41 22 767 59 34	Martin.Dentan@cern.ch

* ATLAS Radiation Hardness Assurance leader in the Sub-system.

7.2. Minutes of RHAWG meetings:
 

Minutes	Transparencies
1st meeting 03-Sep-99	.
2nd meeting 07-Dec-99	.
3rd meeting 10-Feb-00	.
4th meeting 12-May-00	.
5th meeting 08-Dec-00	Preselection and qualification of electronics for UX15 (M. Dentan) Preparation of ELMB radiation test campaigns (B. Hallgren) Status of power supplies tests made by the CERN Pool (C. Rivetta) Radiation tests made by Pixel (P. Sicho); Preliminary test report (P. Sicho) Radiation tests made by SCT (I. Mandic); Preliminary test report (I. Mandic) Radiation tests made by TRT (P. Farthouat) Radiation tests made by LARG (P.Borgeaud) Radiation tests made by Tile (P. Grenier) Radiation tests made by Muon CSC (V. Polychronakos)

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8.1. ATLAS RHA Standard Forms
 

1.   List of the persons responsible for the RHA for each board 2.   List and quantities of each type of component per board 3.   Summary of radiation tests made or to be made for the preselection of generic components 4.   Summary of radiation tests made for the qualification of production batches 5.   Description of TID test set-up 6.   Description of NIEL test set-up 7.   Description of SEE test set-up 8.   ATLAS Standard TID Test Report (Revision 3 , 12-Jun-01) 9.   ATLAS Standard NIEL Test Report (Revision 3 , 12-Jun-01) 10.  ATLAS Standard SEE Test Report (Revision 3 , 19-Jun-01) 11.  ATLAS Standard RHA Progress Report (Revision 1, 28-Jun-01)

8.2. ATLAS RHA Organisation
 

ATLAS Radiation Hardness Assurance Organisation  (Revision 1, 23-May-01) List of System RHA Coordinators (SRCs) and Board RHA Coordinators (BRCs)  (Revision 1, 23-Jan-02)

8.3. ATLAS Systems RHA Web pages
 

ATLAS TC RHA web pages	ATLAS Systems RHA web pages
PIXEL RHA web page	Pixel RHA web page ; SCIPP Irradiations ; Interlock Box
SCT RHA web page	PS tests ; ABCD ; ABCD2T ; Miguel web page
TRT RHA web page	.
LARG RHA web page	FE links RHA web site ; Alberta Rad Tests ;
TILE RHA web page	Tile Cal RHA web site ; Index Tile Cal radiation tests
MUON CSC RHA web page	.
MUON MDT RHA web page	.
MUON TGC RHA web page	Muon TGC RHA web site
MUON RPC RHA web page	Muon RPC RHA web site
MAGNET CONTROL RHA web page	.
DCS RHA web page	. LMB ; 1999 TCC2 Proton test ;  . 1998 LMB neutron test ; . ATLAS DCS Workshop 101001
CRANE RHA web page	.
CRYOGENICS RHA web page	.
ALARM RHA web page	.
JCOV RHA web page	JCOV Web Site
DPSSG RHA web page	DPSSG web site

8.4. Global Progress Reports
 

PPT_04_OCT_01	.
.	.
.	.
.	.
.	.
.	.

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General

Digest on radiation effects on electronics components (M. Dentan): Course 1.pdf

Digest on radiation effects on electronics circuits (M. Dentan) Course 2.pdf

CERN training on radiation effects on electronics circuits Here

Introduction to single event effects (SEE)

Computational method for estimation of Single Event Upset rate in an accelerator environment (CERN / F.Faccio, M.Huhtinen) Here

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LHCC Electronics Board Workshops

4th Workshop on Electronics for LHC Experiments - LEB 1998

5th Workshop on Electronics for LHC Experiments - LEB 1999 - Proceedings LEB 1999

6th Workshop on Electronics for LHC Experiments - LEB 2000 - Proceedings LEB 2000

7th Workshop on Electronics for LHC Experiments - LECC2001 - Proceedings

8th Workshop on Electronics for LHC Experiments - LECC2002 - Proceedings

International Conferences on Radiation Effects

Nuclear and Space Symposium - NSS 2003

Nuclear and Space Radiation Effect Conference - NSREC

Radiation Effects on Conponents and Systems - RADECS 2000 ; RADECS 2001 RADECS2003

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ESA standard test procedures

Document "ESA/SCC 2900.pdf"                           Standard TID test procedure (gamma tests).

Document "ESA/SCC 25100_ESA.pdf"                Standard SEE test procedure (Single Event Effects tests)

DSCC standard test procedures (web address Here)

Document "Intro MIL STD 883.pdf"                    Introduction to MIL STD 883 standard test procedures;

Document "MIL STD 883 changes.pdf"               Recent changes made on MIL STD 883 test procedures;

Document "MIL STD 883 1017.2.pdf"                Standard NIEL test procedure (neutron tests): see pp. 96-97-98;

Document "MIL STD 883 1019.5.pdf"                Standard TID test procedure (gamma tests): see p. 7 and subsequent;

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ATLAS Working Groups

Detector Power Supplies Steering Group DPSSG

Radiation Background Task Force RBTF

LHC Project

Radiation Working Group RADWG

CERN RD49

RD49 COTS page

Radtol RD49 Home Page

Radtol RD49 Password Protected Home Page (Contact Alexandro Marchioro)

Databases

JPL Radiation Effect Database

NASA Radiation Effect and Analysis

NASA Parts and packaging Program

DTRA Electronics Radiation Response Information Center

SPUR "COMRAD" Radiation Database

Commercial rad-hard technologies

TEMIC Web site

Honeywell Technology Center Web site

Commercial standard technologies

Radiation Tolerant XILINX

National SC Web site

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