TOP-13-001:
Measurement of top-quark polarization in t-channel single-top production
Abstract
This note documents the measurement of top-quark polarization in t-channel single-top production, analyzing approximately
of pp collisions at a center-of-mass energy of 8 TeV. A high-purity sample of t-channel single-top events is defined, signal and background components are estimated by a fit to data, and an unfolding technique is applied to infer the parton-level distribution of an angular observable sensitive to the top-quark polarization. The unfolded distribution, which is compatible with the standard model expectation, is used to extract the top-quark spin asymmetry,
. That corresponds to a top-quark polarization
under the assumption that the spin analyzing power of a charged lepton is 100%.
Result
under the assumption that the spin analyzing power of a charged lepton is 100%.
Figures in PAS
Click on image for pdf version of figure.
All processes are normalized to the outcome of the fit.
The uncertainty on the MC, illustrated by the dashed lines, takes into account the systematic uncertainties.
Figure |
Caption |
|
|
Figure 1 (top) BDT response in the muon (left) and electron (right) channel. |
|
|
Figure 1 (middle) Zoom to signal enriched region. |
|
|
Figure 1 (bottom) cosθ* distribution for events passing the analysis threshold on the BDT discriminant. |
|
|
Figure 2 (top) Control plots of the BDT discriminant in "2jets 0tags" control region in muon channel (left) and electron channel (right), using the MADGRAPH generator for W+jets after reweighting. The uncertainty on the MC, illustrated by the dashed lines, takes into account the systematic uncertainties. |
|
|
Figure 2 (bottom) Control plots of cosθ* in "2jets 0tags" control region in muon channel (left) and electron channel (right), using the MADGRAPH generator for W+jets after reweighting. The uncertainty on the MC, illustrated by the dashed lines, takes into account the systematic uncertainties. |
|
|
Figure 3 (top) Control plots of the BDT discriminant in "3jets 1tag" control region in muon channel (left) and electron channel (right). The uncertainty on the MC, illustrated by the dashed lines, takes into account the systematic uncertainties. |
|
|
Figure 3 (bottom) Control plots of cosθ* in "3jets 1tag" control region in muon channel (left) and electron channel (right). The uncertainty on the MC, illustrated by the dashed lines, takes into account the systematic uncertainties. |
|
|
Figure 4 (top) Control plots of the BDT discriminant in "3jets 2tags" control region in muon channel (left) and electron channel (right). The uncertainty on the MC, illustrated by the dashed lines, takes into account the systematic uncertainties. |
|
|
Figure 4 (bottom) Control plots of cosθ* in "3jets 2tags" control region in muon channel (left) and electron channel (right). The uncertainty on the MC, illustrated by the dashed lines, takes into account the systematic uncertainties. |
|
|
Figure 5 Unfolded data distribution cosθ*unfolded compared to the generated distribution from POWHEG and COMPHEP, in the muon (left) and electron (right) channel. Error bars represent statistical uncertainties. |
Tables in PAS
Table |
Caption |
|
Table 1 Scale factors and uncertainties for the BDT fit. |
|
Table 2 Event yields for the main processes in the signal region after the BDT selection. The yields are normalized to the results of the fit to the BDT response. |
|
Table 3 List of systematic uncertainties and their impact to the measurement of for the muon () and electron channel (). |