Cambridge University Capabilities

Dedicated cleanroom for the probing and testing of silicon devices. Facilities include

• Summit 10K automatic (PC-controlled) probestation from Cascade Microtech
• Wentworth manual probestation
• K&S 4129 Deep Access Bonder
• K&S 1470 automatic bonder for production wire bonding
• Environment Chamber from Design Environmental Ltd for irradiated detector annealing and temperature cycling tests
• Bosch freezers for irradiated detector storage and testing

Measurements performed using a range of instrumentation from Keithley ,  Hewlett-Packard , Wayne-Kerr and Pickering Interfaces

• Keithley 487 Volt Source/Picoammeter - "workhorse" for IV scans and I measurements / Vsource
• Keithley 6517 Electrometer - IV scans, VV scans, High voltage source (up to 1000V)
• Keithley 2000 DMM - for current, voltage, temperature measurements etc
• WayneKerr 6425 - CV measurements from 30Hz to 300kHz
• Hewlit-Packard 4263B - CV to 100kHz
• Pickering 360-20 4x36 matrix for switching applications

Taken from http://www.hep.phy.cam.ac.uk/~silicon/cavintro1.html#TEST

-- SotirisFragkiskos - 05-Sep-2011